Ardext Technologies software achieves 65% test time reduction for Texas Instruments

Ardext Technologies Software Achieves 65% Test Time Reduction for Texas Instruments

Tucson, Arizona March 27, 2003 Ardext Technologies, a producer of RF, Analog and Mixed Signal test time reduction software for the semiconductor industry has helped Texas Instruments achieve a 65% reduction in test times on its production floor, significantly reducing the cost of test.

Bob Cometta, Test Engineering Manager for TI’s Tucson facility noted, “We’ve been really impressed with the test time reductions we’ve seen using Ardext’s software and the support the company has provided to get us up and running. We selected precision Op Amps to get started to prove the capability and to work out the logistics. The support from Ardext was very good, especially when challenged to find the last few nV of correlation differences. Our next step will be to utilize this technology on some very high-resolution Data Conversion circuits to see the capability and the savings.”

According to Doug Goodman, Ardext’s CEO, “We are pleased to have Texas Instruments purchase our products. TI has a fantastic reputation in the industry for developing innovative analog and mixed signal components. Their adoption of the Ardext tools is very positive, and underscores the needs for ATE-independent test cost solutions.

Ardext Technologies, Inc. is a software company offering a full line of ATE platform independent software to semiconductor manufacturers and test outsourcing companies. Ardext’s proprietary FASTest software can double; triple or more the rate at which analog and mixed signal semiconductor devices can be tested, significantly reducing the cost of semiconductor device testing. The company was founded in 2000 from research initiatives at the Georgia Institute of Technology and with support from Yamacraw, Georgia’s unique economic development initiative. Ardext’s main offices are in Tucson, Ariz., and Atlanta.

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